2019 Fall WVASE Online Short Course
September 17, 2019 (Tuesday)
September 19, 2019 (Thursday)
September 24, 2019 (Tuesday)
September 26, 2019 (Thursday)
October 1, 2019 (Tuesday)
October, 3, 2019 (Thursday)
2:00pm Eastern Daylight Time
1:00pm Central Daylight Time
12:00 noon Mountain Daylight Time
11:00am Pacific Daylight Time
Each session is 1.5 to 2 hours in length.
Customers using WVASE® software
Registration ends September 10, 2019
Limited space available.
$300 Standard Price
$150 University Price
Woollam Tuition Credits can be applied (2 participants per credit)
The J.A. Woollam Company is proud to announce an Internet-based ellipsometric data analysis course designed for WVASE® software users. We will introduce the fundamentals of data analysis at a beginner to intermediate level. There will be six session in total, with two sessions per week spread out over a 3 week period. The sessions will be ~1.5 to 2 hours long.
If you use a different J.A. Woollam software package (i.e. CompleteEASE), please contact us for details regarding pertinent courses of interest for you.
Each registered participant will be invited to participate in sessions, and to view recordings of each session afterwards. In addition to internet-sessions, students will receive relevant example data sets to practice. Homework can be sent to the instructor as a WVASE® environment file for review prior to the next session. Registered participants who submit all the homework will receive Certificates of Participation.
The Registration fee also includes pdf copies of the sessions and a pdf copy of the WVASE® Software Training manual as a download.
Participants must have internet access to participate in the webinar so they can log onto the course via GoToWebinar®. For audio, participants can either call one of the numbers provided by GoToWebinar® at the time of the session, or access audio from their computer via a VoIP connection from GoToWebinar® . Participants who are from the same organization/facility are welcome to participate from a conference room using a commonly shared computer, projector and audio connection.
Recordings of all sessions will made available to registered participants during the course and for a period afterwards.
For more information please contact Tom Tiwald at firstname.lastname@example.org
Click here to register. Space is limited.
SCHEDULE – Week 1
Session 1: Introduction to Ellipsometry
- Modeling overview
- Modeling Semiconductor substrates
Session 2: Dielectric substrates & transparent films
- The Cauchy function
- Films: Thickness & index effects
- Surface roughness, Global fits, Simple Grading
- Ultra thin films
SCHEDULE – Week 2
Session 3: Pt-by-pt fits & Intro to the Genosc layer
- Point-by-point fits for UV-absorbing materials
- Introduction to the Genosc layer
- Oscillator functions
- Fitting reference materials in the Genosc layer
Session 4: Applying the Genosc layer to ellipsometric data
- Using prebuilt Genosc layers
- Building Genosc layers from reference
- Create reference from pt-by-pt fit, then build Genosc layer
SCHEDULE – Week 3
Session 5: Nonideal samples & introduction to anisotropy
- Nonideal samples: measurements, modeling & analysis
- Anisotropy: description, modeling & analysis (anisotropic transparent films only)
Session 6: Absorbing materials & review
- Opaque substrates
- Combining ellipsometry with transmission data
- Interference Enhancement
- Brief review of short course
Registration has ended.
Upon receipt of registration, an invoice will be sent via email.
All payments are due by September 10, 2019. Visa and MasterCard are accepted.