Why an IR-VASE Mark II?
Wide Spectral Range
Covers near to far infrared.
1.7 to 30 microns
(333 to 5900 wavenumbers)
Resolution from 1cm-1 to 64cm-1
High Sensitivity to Ultra-thin Films
Spectroscopic ellipsometry data contain both “phase” and “amplitude” information from reflected or transmitted light. The phase information from IR ellipsometry offers higher sensitivity to ultrathin films than FTIR reflection/absorbance, while retaining the sensitivity to chemical composition.
The IR-VASE offers non-contact, non-destructive measurements of many different material properties. Measurements do not require vacuum, and can be used to study liquid/solid interfaces common in biology and chemistry applications.
No Baseline or Reference Sample Required
Ellipsometry is a self-referencing technique that does not require reference samples to maintain accuracy. Samples smaller than the beam diameter can be measured because the entire beam does not need to be collected.
Highly Accurate Measurement
Patented calibration and data acquisition procedures, provide accurate measurements of Ψ and Δ over the full range of the instrument. The IR-VASE can determine both n and k for materials over the entire spectral range from 1.7 to 30 microns without extrapolating data outside the measured range, as with a Kramers-Kronig analysis. Perfect for thin films or bulk materials including dielectrics, semiconductors, polymers, and metals.