Dr. Tom Tiwald
Tom received his Ph.D. in electrical engineering from the University of Nebraska-Lincoln. Ph.D. research focused on infrared ellipsometry to study free carrier and phonon absorptions in semiconductors. Also studied the infrared properties of anodic SiO2, thin films and plasma-treated polycarbonates.
Prior to that, he worked with SIMS, AES, and other surface spectroscopies in the semiconductor industry.
Tom joined the J.A. Woollam Company in 1999 in the Applications group. Since then, he has helped customers utilize ellipsometry for a wide range of applications, including infrared optical materials, optical properties vs. temperature measurements, as well as liquid cell, in situ and web coating process monitoring and control. He has also trained new customers on how to use their instruments and perform data analysis.
Over years Tom has helped develop and present more than 80 Data Analysis short courses using WVASE and CompleteEASE software, and in recent years he has developed and presented several internet-based short courses devoted to the analysis of VASE, CompleteEASE and IR-VASE ellipsometric data.