Why an M-2000?
Advanced Ellipsometer Technology
The M-2000 utilizes our patented RCE (rotating compensator ellipsometer) technology to achieve high accuracy and precision.
Fast Spectral Detection
The RCE design is compatible with advanced, proven CCD detection to measure ALL wavelengths simultaneously.
Wide Spectral Range
Collect over 700 wavelengths from the ultraviolet to the near infrared – all simultaneously.
Flexible System Integration
With modular optical design, the M-2000 is suited for direct attachment to your process chamber or configured on any of our table-top bases.
Advanced design ensures accurate ellipsometry measurements for any sample.