Applications Group


Andrea Donohue

Andrea received a B.S. degree in physics and psychology from the University of Nebraska-Lincoln in December of 2003. She spent one year in the physics department at Vanderbilt University (Nashville, TN) taking graduate courses in electromagnetic theory, quantum mechanics, and statistical mechanics. Andrea began working part-time for the J.A. Woollam Company in 2001 while working on her undergraduate degree. She spent a little under two years working full-time in production and in the Fall of 2006 joined the applications team.

James Hilfiker

James received his Master’s degree in electrical engineering at the University of Nebraska-Lincoln. As an undergraduate, he was involved in research on computer simulations of high-speed microelectronic devices. His graduate interests included materials processing, multilayered nanostructures, and in situ spectroscopic ellipsometry. He designed and built a liquid cell for in situ monitoring of electrochemical deposition. James has been an applications engineer with the J.A. Woollam Company since 1995. His recent publications involve vacuum ultraviolet ellipsometry and liquid crystal characterization.

Nina Hong

Nina received her Ph.D. in physics at the University of Nebraska-Lincoln. She holds Bachelor and Master degrees in physics from Hanyang University in South Korea. Her research focused on room-temperature solid-state neutron detectors using boron-rich carbon thin films. She has extensive experience in UHV thin film deposition including Plasma-Enhanced Chemical Vapor Deposition and Physical Vapor Deposition. Her graduate research also involved material characterization using AES, XPS, XRD, XRR, IR/Raman Spectroscopy, AFM/MFM, and IV/CV measurements. Nina joined the applications team in July 2012.

Andrew Martin

Andrew received a Master’s degree in electrical engineering at the University of Nebraska- Lincoln. As a graduate student, he focused the degradation of anti-reflective coatings in a Low Earth Orbit (LEO) environment. Andrew began working part-time for the J.A. Woollam Company in 2004 while working on his undergraduate degree in computer engineering. He joined the applications team in 2009.

Greg Pribil

Greg holds a B.S. degree in electrical engineering from the University of Nebraska-Lincoln. His graduate research includes development of a hollow cathode reactive sputtering UHV system with magnetic field confinement. His research focuses on the deposition of a-Si:H, a-Ge:H and a-SiGe:H thin films for use in solar cells. He has been an applications engineer at the J.A. Woollam Company since January 2002 and works with the in situ spectroscopic ellipsometry group.

Neha Singh

Neha received a Master’s degree in electrical engineering at the University of Nebraska- Lincoln. As a graduate student, she focused on femtosecond laser ablation of metal surfaces. She joined the J.A. Woollam Company applications team in 2005, after completing an internship in the analytical services laboratory

Jianing Sun

Jianing received her Ph.D. in Materials Science and Engineering from the University of Michigan – Ann Arbor.  She holds Master and Bachelor degrees in Chemical Engineering from Tsinghua University in China. Her Ph.D. research involved characterizing low-dielectric constant thin films using Positronium Annihilation Lifetime Spectroscopy (PALS). She worked as a process engineer on back-end processes and characterizations in the semiconductor industry and lecturer at University of Nebraska before joining J.A. Woollam Company in 2008 as an Applications Engineer.

Ron Synowicki

Ron holds a B.S. degree in physics and a Master’s degree in electrical engineering from the University of Nebraska-Lincoln. His master’s research involved laboratory simulation of materials degradation in Low Earth Orbit. He has worked in the analytical services laboratory at J.A. Woollam Company since 1993, specializing in customer applications development and service measurements using spectroscopic ellipsometry.

Tom Tiwald

Tom received his Ph.D. in electrical engineering from the University of Nebraska-Lincoln. His Ph.D. research focused on infrared free carrier and phonon absorptions in semiconductors. He also studied the infrared properties of anodic SiO2, thin films, and plasma-treated polycarbonates. Prior to that, he worked with SIMS, AES, and other surface spectroscopies in the semiconductor industry. He joined the J.A. Woollam Company in 1999 as an applications engineer.

Jeremy VanDerslice

Jeremy received his Master’s degree in mechanical engineering from the University of Nebraska. He is working towards his Ph.D. in engineering where he is studying pulsed-laser deposited films using spectroscopic ellipsometry and is currently building a chamber for in-situ ellipsometric characterization of PLD-grown films. Jeremy joined the J.A. Woollam Company as an applications engineer in 2010.