CompleteEASE Data Analysis Short Course


Center for High Technology Materials at University of New Mexico, Albuquerque, NM


August 1-3, 2017 (Tues.-Thurs.)


9am-5pm each day (Registration begins at 8:30am on August 1st)

Daily Overview:

  • Basic theory
  • Overview of Data Analysis Strategies
  • Transparent layers
  • Cauchy Dispersion
  • Thickness PreFit
  • Global Fit
  • Roughness
  • Index Grading
  • Parameterize Layer
  • Semi-Absorbing Films
  • Wavelength Expansion Fits
  • B-Spline
  • Gen-Osc
  • Oscillator Model Theory

  • Fitting SE + Transmission
  • Non-idealities: thickness non-uniformity, bandwidth, backsurface reflections & depolarization
  • Multiple-Sample Analysis
  • Review

The J.A. Woollam Company is proud to announce a data analysis course designed for CompleteEASE users.  We will introduce the fundamentals of data analysis at a beginner to intermediate level. All details will be described using the latest CompleteEASE software (currently version 6.0). This version of software will be provided to all attendees to take home with them after the course. This course is not intended for users that work with other software packages, such as WVASE or VASEManager. As with our other analysis courses participants will work computer examples throughout all sessions.

Please note this short course requires participants to bring their own Windows laptop.

If you have questions please contact Alex Wilkason at

Register Here:

Registration is now closed.