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[1] For more information, visit www.polymtl.ca/larfis/en |
| [2] NSERC Multisectorial Industrial Research Chair in Coatings and Surface Engineering. |
| [3] M. Caron, O.Zabeida, J.E. Klemberg-Sapieha, L. Martinu, “Stability and performance of organic-inorganic thin films on polymer substrates,” Surf. Coat. Tech. 314 (2017) 131-138. |
| [4] W. Trottier-Lapointe, O. Zabeida, T. Schmitt, L. Martinu, “Ultra-Low Refractive Index Optical Films with Enhanced Mechanical Performance Obtained by Hybrid Glancing Angle Deposition,” Appl. Opt. 55 (2016) 8796-8805. |
| [5] L. Martinu, D. Poitras, “Plasma Deposition of Optical Films and Coatings: A Review,” J. Vac. Sci. Technol. A 18 (2000) 2619-2645. |
| [6] A. Bergeron, D. Poitras, L. Martinu, “Interphase in Plasma deposited Silicon Nitride Optical Films on Polycarbonate: In-situ Ellipsometric Characterization,” Opt. Eng. 39 (2000) 825-831. |
| [7] A. Bergeron, J.E. Kemberg-Sapieha, L. Martinu, “Structure of the Interfacial Region between Polycarbonate and Plasma deposited SiN1.3 and SiO2 Optical Coatings Studied by Ellipsometry,” J. Vac. Sci. Technol. A 16 (1998) 3227-3234. |
| [8] A. Amassian, P. Desjardins, L. Martinu, “Study of TiO2 Film Growth Mechanism in Low-Pressure Plasma by in situ real-time spectroscopic ellipsometry,” Thin Solid Films 447-448 (2004) 40-45. |
| [9] Amassian, P. Desjardins, L. Martinu, “Ion-Surface Interactions on c-Si (001) at the Radiofrequency-Powered Electrode in Low-Pressure Plasmas: Ex Situ Spectroscopic Ellipsometry and Monte-Carlo Simulation Study,” J. Vac. Sci. Technol. A 24 (2005) 45. (also selected to appear in the December 19 issue of the Virtual Journal of Nanoscale Science and Technology). |
| [10] Amassian, M. Svec, P. Desjardins, L. Martinu, “Interface Broadening Due to Ion Mixing During Thin Film Growth at the Radio-Frequency-Biased Electrode in a Plasma-Enhanced Chemical Vapor Deposition Environment,” J. Vac. Sci. Technol. A 24 (2006) 2061-2069. |
| [11] A. Amassian, M. Svec, P. Desjardins, L. Martinu, “Dynamics of Ion Bombardment-Induced Modifications of Si(001) at the Radiofrequency-Biased Electrode in Low-Pressure Oxygen Plasmas: In Situ Spectroscopic Ellipsometry and Monte-Carlo Study,” J. Appl. Phys. 100 (2006) 063526. |
| [12] M. Hala, N. Viau, O. Zabeida, J. E. Klemberg-Sapieha, L. Martinu, “Dynamics of reactive high power impulse magnetron sputtering discharge studied by time- and space-resolved optical emission spectroscopy and fast imaging,” J. Appl. Phys. 107 (2010) 043305-1-9. |
| [13] M. Hála, R. Vernhes, O. Zabeida, J. E. Klemberg-Sapieha and L. Martinu, “Reactive HiPIMS deposition of SiO2/Ta2O5 optical interference filters,” J. Appl. Phys. 116 (2014) 213302. |
| [14] K. Kaminska, A. Amassian, L. Martinu, K. Robbie, “Growth of Vacuum Evaporated Ultra-Porous Silicon Studied with Spectroscopic Ellipsometry and Scanning Electron Microscopy,” J. Appl. Phys. 97 (2005) 13511. |
| [15] Amassian, R. Vernhes, J.E. Klemberg-Sapieha, P. Desjardins, L. Martinu “Interface Engineering During Plasma-enhanced Chemical Vapor Deposition of Porous/dense SiN1.3 Optical Multilayers,” Thin Solid Films 469-470 (2004) 47-53. |
| [16] R. Vernhes, J.E. Klemberg-Sapieha, L. Martinu, “Fabrication and testing of nanoporous Si3N4 optical filters for gas sensing applications,” Sensor Actuat. B-Chem. 185 (2013) 504–511. |
| [17] D. Dalacu, L. Martinu, “Spectroellipsometric Characterization of Plasma-deposited Au/Fluoropolymer Nanocomposite Films,” J. Vac. Sci. Technol. A 17 (1999) 877-883. |
| [18] D. Dalacu, L. Martinu, “Spectroellipsometric Characterization of Plasma-deposited Au/SiO2 Nanocomposite Films,” J. Appl. Phys. 87 (2000) 228. |
| [19] J.-M. Lamarre, F. Billard, C. Harkati-Kerboua, M. Lequime, S. Roorda, L. Martinu, “Anisotropic Nonlinear Optical Absorption of Gold Nanorods in a Silica Matrix,” Opt. Commun. 281 (2008) 331–340. |
| [20] S. Hafezian, B. Baloukas, L. Martinu,”Percolation threshold determination of sputtered silver films using Stokes parameters and in situ conductance measurements,” Appl. Opt. 53 (2014) 5367-5374. |
| [21] J.N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S.M. Smith, J.H. Baker, H.G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516 (2008) 7979-7989. |
| [22] P. Jedrzejowski, A. Amassian, E. Bousser, J.E. Klemberg-Sapieha, L. Martinu, “Real-Time In-Situ Growth Study of TiN- and TiCxNy- Based Superhard Nanocomposite Coatings Using Spectroscopic Ellipsometry,” Appl. Phys. Lett. 88 (2006) 071915. |
| [23] P. Jedrzejowski, B. Baloukas, J.E. Klemberg-Sapieha, L. Martinu, “Optical Characteristics and Color of TiN/SiN1.3 Nanocomposite Coatings,” J. Vac. Sci. Technol. A 22 (2004) 725-733. |
| [24] J.-P. Fortier, B. Baloukas, O. Zabeida, J.E. Klemberg-Sapieha, L. Martinu, “Thermochromic VO2 thin films deposited by HiPIMS,” Sol. Energ. Mat. Sol. C. 125 (2014) 291-296. |
| [25] S. Loquai, B. Baloukas, J.E. Klemberg-Sapieha, L. Martinu, “HiPIMS-deposited thermochromic VO2 films with high environmental stability,” Sol. Energ. Mat. Sol. C. 160 (2017) 217-224. |
| [26] S. Loquai, B. Baloukas, O. Zabeida, J.E. Klemberg-Sapieha, L. Martinu, “HiPIMS-deposited thermochromic VO2 films on polymeric substrates,” Sol. Energ. Mat. Sol. C. 155 (2016) 60-69. |
| [27] B. Baloukas, S. Loquai, L. Martinu, “VO2-based thermally active low emissivity coatings,” Sol. Energ. Mat. Sol. C. 183 (2018) 25–33. |
| [28] R. Beaini, B. Baloukas, S. Loquai, J.E. Klemberg-Sapieha, L. Martinu, “Thermochromic VO2-based smart radiator devices with ultralow refractive index cavities for increased performance”, Sol. Energ. Mat. Sol. C. 205 (2020) 110260. |
| [29] B. Baloukas, J.-M. Lamarre, L. Martinu, “Electrochromic interference filters fabricated from dense and porous tungsten oxide films,” Sol. Energ. Mat. Sol. C. 95 (2011) 807-815. |
| [30] H. Camirand, B. Baloukas, J. E. Klemberg-Sapieha, L. Martinu, “In situ spectroscopic ellipsometry of electrochromic amorphous tungsten oxide films,” Sol. Energ. Mat. Sol. C. 140 (2015) 77-85. |
| [31] L. Dubé-Riopel, B. Baloukas, O. Zabeida, L. Martinu, “In situ and ex situ spectroscopic ellipsometry of electrochromic NiO films,” in Optical Interference Coatings Conference (OIC) 2019, OSA Technical Digest (Optical Society of America, 2019), paper ThC.6. |
| [32] A. Amassian, M. Dudek, O. Zabeida, S.C. Gujrathi, J.E. Klemberg-Sapieha, L. Martinu, “Oxygen Incorporation and Charge Donor Activation via Subplantation During the Growth of Indium Tin Oxide Films,” J. Vac. Sci. Technol. A 27 (2009) 362-366. |
| [33] B. Baloukas, M. A. Arvizu, R.-T. Wen, G. A. Niklasson, C. G. Granqvist, R. Vernhes, J. E. Klemberg-Sapieha, L. Martinu, “Galvanostatic rejuvenation of electrochromic WO3 thin films: Ion trapping and detrapping observed by optical measurements and by time-of-flight secondary ion mass spectrometry,” ACS Appl. Mater. Inter. 9 (2017) 16995–17001. |
| [34] F. Blanchard, B. Baloukas, L. Martinu, “Highly durable electrochromic tungsten oxide thin films prepared by high rate bias-enhanced sputter deposition,” Appl. Mater. Today 12 (2018) 235–243. |
| [35] A. Sytchkova, R. Vernhes, B. Baloukas, M. L. Grilli, L. Martinu, A. Piegari, “Ellipsometric monitoring of the refractive index evolution versus temperature for various metal oxides commonly used in interference filters,” in Optical Interference Coatings (OIC) 2016, OSA Technical Digest (Optical Society of America, 2016), paper WC.2. |
| [36] G. Vajente, R. Birney, A. Ananyeva, S. Angelova, R. Asselin, B. Baloukas, R. Bassiri, G. Billingsley, M.M. Fejer, Des Gibson, L.J. Godbout, E.K. Gustafson, A. Heptonstall, J. Hough, S. MacFoy, A. Markosyan, I.W. Martin, L. Martinu, P.G. Murray, S.D. Penn, S. Roorda, S. Rowan, F. Schiettekatte, R. Shink, C. Torrie, D. Vine, S. Reid, R.X. Adhikari, “Effect of elevated substrate temperature deposition on the mechanical losses in tantala thin film coatings,” Classical Quant. Grav. 35 (2018) 075001. |
| [37] R. Vernhes, A. Amassian, J. E. Klemberg-Sapieha, L. Martinu, “Plasma Treatment of Porous SiNx:H Films for the Fabrication of Porous-Dense Multilayer Optical Filters with Optimized Interfaces,” J. Appl. Phys. 99 (2006) 114315. |
| [38] S. Woodward-Gagné, N. Desjardins-Lecavalier, B. Baloukas, O. Zabeida, L. Martinu, “Tailoring angular selectivity in SiO2 slanted columnar thin films using atomic layer deposition of titanium nitride,” Opt. Mater. Express 9 (2019) 4556-4563. |
