Further Reading

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
by Harland G. Tompkins, James N. Hilfiker
Momentum Press, 2016.

ISBN 978-1606507278

Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental Principles and Solar Cell Characterization
by Hiroyuki Fujiwara (Editor), Robert Collins (Editor)
Springer, 2018.

ISBN 978-3319753751

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