Home > Products > alpha-SE
Search



Web
jawoollam.com

Events

 

 

 

alpha-SE® Ellipsometer

alpha-SE spectroscopic ellipsometer

For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds.






alpha-SE Ellipsometer Video

AVI download (1.4MB)

 

 

 

 


alpha-SE ellipsometer spectral range

 

Why an alpha-SE?

Easy-to-Use
Push-button operation is complemented by advanced software that takes care of the work for you.

Powerful
Proven spectroscopic ellipsometer technology gives you both thickness and index with much higher certainty than other techniques.

Flexible
Works with your materials - dielectrics, semiconductors, organics, and more.

Affordable
Spectroscopic ellipsometry for simple sample systems.

Fast
Hundreds of wavelengths simultaneously collected in seconds for immediate results.

alpha-SE ellipsometer sample measurement

 

 
Request an Ellipsometer Quote
  What's New
   
 

Facebook and LinkedIn

   
  In Situ SE Chapter
   
  American Vacuum Society Awards
   

Home | Products & Services | Sales & Support | Resources | About Us | Contact Us

© 2014 J.A. WOOLLAM CO. INC.
645 M STREET, SUITE 102
LINCOLN, NE 68508-2243 USA
Ph. 402.477.7501 | Fx. 402.477.8214
sales@jawoollam.com
Woollam Facebook Page Woollam LinkedIn Page