alpha-SE® Ellipsometer

alpha-SE spectroscopic ellipsometer

For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds.







alpha-SE ellipsometer spectral range

 

Why an alpha-SE?

Easy-to-Use
Push-button operation is complemented by advanced software that takes care of the work for you.

Powerful
Proven spectroscopic ellipsometer technology gives you both thickness and index with much higher certainty than other techniques.

Flexible
Works with your materials - dielectrics, semiconductors, organics, and more.

Affordable
Spectroscopic ellipsometry for simple sample systems.

Fast
Hundreds of wavelengths simultaneously collected in seconds for immediate results.

alpha-SE ellipsometer sample measurement

 

 
 

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LINCOLN, NE 68508-2243 USA
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