IR ellipsometry data acquisition and analysis requires unique skills that are different than UV/visible wavelength ellipsometry. We are offering this on-demand course to help our IR-VASE® customers develop these skills using the CompleteEASE® software for data analysis. The course will consist of  10 sessions. The last two sessions are optional.

  • Each registered participant will receive video links for all sessions, several how-to videos, references, as well as data files for examples and homework for each session.
    • Completed homework can be emailed to homework@jawoollam.com as a CompleteEASE Snapshot file, to be review by instructors. Registered participants who submit >70% of the homework from sessions 3 through 8 will receive a certificate of participation.
    • Sessions 9 and 10 are optional, since not every participant may be interested in modeling phonons and anisotropy.
  • Woollam Instructors will be available to answer questions via email and live interactions (via MS Teams or Zoom).

Register below. For more information please contact Tom Tiwald at ttiwald@jawoollam.com.

Session 1: Introduction to Infrared Ellipsometry

  • Light & Polarization
  • Instrumentation
  • Light & materials
  • Interfaces & films
  • Intro to Modeling & Analysis
  • Intro to CompleteEASE Software

Session 2: Sample Preparation + Data Acquisition

  • IR-VASE Scan dialog box
  • Choosing acquisition parameters
  • Backside reflections & Backside roughening
  • Beam size & masking

Session 3: Transparent substrates and films

  • Introduction to the Genosc layer for transparent materials
  • Fitting Transparent Substrates
  • Fitting Transparent Films: Interpreting Ψ oscillations, index contrast & thickness
  • Surface Roughness & Grading

Session 4: Absorbing substrates and films

  • Introduction to the IR B-Spline layer
  • B-Spline IR modeling of absorbing substrates
  • Glasses, amorphous & Crystalline materials
  • B-Spline IR modeling of absorbing films

Session 5: Modeling absorption with Genosc layer

  • Using Genosc oscillators to model absorption
  • Lorentz & Gaussian oscillators
  • Using Genosc layers from the IR Library
  • Converting from B-Spline to Genosc

Session 6: Free Carrier Effects (doping)

  • The Drude model & fitting doped substrates
  • Sensitivity to free carriers at IR wavelengths
  • Fitting Doped substrates & layers

Session 7: Non-ideal samples and measurements

  • Effects of non-idealities on Ψ & Δ
  • %Depolarization
  • Modeling non-idealities

Session 8: Advanced Topics I – Multisample + Multi-dataset analysis

  • Multisample (Multi-dataset) Analysis
  • Analysis of combined IR-VASE & UV-visible-NIR data
  • Analysis of combined ellipsometric & transmission data

Session 9: Advanced Topics II – phonons, TOLO and anharmonic oscillators

  • Anharmonic vs. Harmonic oscillator functions
  • The Dielectric (epsilon) & Loss (-1/epsilon) functions
  • Product (TOLO) & the Sum (anharmonic Lorentz) forms of the dielectric function
  • Fitting infrared phonon with the TOLO and anharmonic Lorentz oscillators

Session 10: Introduction to Anisotropy

  • Description
  • Measurement
  • Building Anisotropic models

Registration