The T-Solar™ ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples. Based on the established
M-2000® rotating compensator spectroscopic ellipsometer, the T-Solar measures
hundreds of wavelength across the UV-Visible-NIR. To improve performance on
rough, textured surfaces that signifi cantly reduce refl ected signal, the T-Solar
combines a special High-Intensity Lamp source with our new Intensity-Optimizer*.
The T-Solar is perfect for characterizing AR coatings on etched silicon surfaces. In
addition, the T-Solar features an adjustable tilt-rotation-stage*, which is required to
align the pyramid structures of alkaline-etched monocrystalline surfaces1.

PV Applications: • Textured Mono- and    Multicrystalline Substrates • AR Coatings (SiNx, AlNx...) • Transparent Conductive    Oxides    – ITO                  – ZnOx    – doped SnO2    – AZO • a-Si, μc-Si, poly-Si • CdTe, CdS, CIGS • Organic PV Materials • Dye Sensitized Films	The Intensity-Optimizer* allows convenient control of measurement signal to match the ideal range for any sample. Very useful when switching between metal, glass, and even textured substrates that will have a large variation in refl ected signal.
T-Solar™ Sample Stage is fully adjustable for textured, pyramidal surfaces. Tilt and rotate sample to align pyramid facets with ellipsometer probe-beam.

* Patent-pending
1 J. Sun et al., “Characterizing AntiRefl ection Coatings on textured Mono-Crystalline Silicon
with Spectroscopic Ellipsometry”, submitted to IEEE 34th PVSC Proc., 2009.