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Short Courses

Ellipsometry Data Analysis Short Course

Short courses focus on data analysis methods used in spectroscopic ellipsometry with a significant amount of "hands-on" computer time.

Familiarity with the J.A. Woollam WVASE32 software is recommended but not required to benefit from our thorough course on spectroscopic ellipsometry. All sessions are taught by applications engineers from the Woollam Company.

WVASE32 Data Analysis Fundamentals Course Outline

Day 1: Intro to Ellipsometry

Basic Theory

Fundamentals of Optical Constants

Overview of data analysis strategies

Substrates

Day 3: Absorbing Films

Oscillator Model Theory

Generalized Oscillator Layer

Analysis of Absorbing Films

Day 2: Ellipsometry Analysis

Transparent Layers
- Cauchy Dispersion
- Global Fitting
Microstructure

Roughness
Simple Index Grading

UV Absorbing
- Point-by-point Fitting

Day 4: Intermediate Methods

Depolarization

Model Non-idealities

Function-based rading

*Day 4 features a series of short discussions on a wide variety of topics. Software and hardware demonstrations are also included.

J. A. Woollam 2010 Ellipsometry Short Courses

Date	Location	Type
March 1-3, 2010	L.O.T Oriel Darmstadt, Germany	WVASE32 Data Analysis Fundamentals
March 9-12, 2010	University of Central Florida Orlando, Florida	WVASE32 Data Analysis Fundamentals
July 13-16, 2010	Ecole Polytechnique Montreal, Canada	WVASE32 Data Analysis Fundamentals
September 14-17, 2010	J.A. Woollam Co. Lincoln, Nebraska	CompleteEASE Data Analysis Fundamentals
November 10-12, 2010	L.O.T. Oriel Darmstadt, Germany	CompleteEASE Data Analysis Fundamentals

HOW TO REGISTER:

Contact: Veronica Cockerill, Marketing Coordinator at vcockerill@jawoollam.com

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