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Short courses focus on data analysis methods used in spectroscopic ellipsometry with a significant amount of "hands-on" computer time. 

Familiarity with the J.A. Woollam WVASE32 software is recommended but to required to benefit from our thorough course on spectroscopic ellipsometry. All sessions are taught by applications engineers from the J. A. Woollam Company.  

 

Standard Course Outline
Day 1: Intro to Ellipsometry
  • Basic theory

  • Instrumentation & data acquisition

  • Fundamentals of optical constants

  • Overview of data analysis strategies

 Day 3: Intermediate Modeling
  • Dispersion models-theory

  • Generalized oscillator layer

  • Analysis of absorbing films
Day 2: Ellipsometry Analysis
  • More transparent layers
    • Cauchy dispersion
    • Global fitting
    • Roughness
    • Simple index grading

  • Transparent and absorbing films
    • Point-by-point fitting
 Day 4: Advanced Analysis
  • Anisotropic data analysis

  • Depolarization

  • Complex grading

*Day 4 features a series of short discussions on a wide variety of topics.  Software and hardware demonstrations are also included.   

J. A. Woollam 2008 Ellipsometry Short Courses

Date

Location Type
June 16-19, 2008
Vanderbilt University
Standard
September 2008
Harvard University
Standard
November 2008
Lincoln, NE, J.A. Woollam Co.
Advanced


HOW TO REGISTER:

Contact Veronica Inlow, Marketing Coordinator at vinlow@jawoollam.com

 

 
   
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