Short courses focus on data analysis methods used in spectroscopic ellipsometry with a significant amount of "hands-on" computer time.
Familiarity with the J.A. Woollam WVASE32 software is recommended but not required to benefit from our thorough course on spectroscopic ellipsometry. All sessions are taught by applications engineers from the Woollam Company.
WVASE32 Data Analysis Fundamentals Course Outline
Day 1: Intro to Ellipsometry
Basic Theory
Fundamentals of Optical Constants
Overview of data analysis strategies
Substrates
Day 3: Absorbing Films
Oscillator Model Theory
Generalized Oscillator Layer
Analysis of Absorbing Films
Day 2: Ellipsometry Analysis
Transparent Layers
Cauchy Dispersion
Global Fitting
Microstructure
Roughness
Simple Index Grading
UV Absorbing
Point-by-point Fitting
Day 4: Intermediate Methods
Depolarization
Model Non-idealities
Function-based rading
*Day 4 features a series of short discussions on a wide variety of topics. Software and hardware demonstrations are also included.