Revolutionary rotating compensator technology. Many spectral ranges available from 193 to 1690nm.

  alpha-SE

Spectroscopic Ellipsometry has never been easier! Simple, low cost system for measuring index and thickness. Spectral range of 380-900nm.

Variable angle spectroscopic ellipsometer with wide spectral range of 193-2500nm.

Spectroscopic ellipsometer covering the vacuum UV to the NIR. Perfect for lithography applications at 248nm, 193nm, and 157nm.

  IR-VASE

Covers a wide spectral range from 2 to 30 microns.
This ellipsometer is used to characterize both thin films and bulk materials.

  AccuMap-SE

Characterizing thin film uniformity of large panels just got easier. The AccuMap-SE combines a high-speed M-2000 spectroscopic ellipsometer with fast mapping for large areas.

  T-Solar

The T-Solar™ ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples.

The most powerful data acquisition and analysis
software packages available on the market.

Our measurements lab is equipped with many different ellipsometers to meet your application.

We offer numerous courses throughout the year for customers to expand and enhance their knowledge about ellipsometry.