Home > About Us > People
Search



Web
jawoollam.com

Events

 

 

 

People

Applications Engineers

Andrea Fuchser
Andrea Donohue
 

Andrea Donohue received a B.S. degree in physics and psychology from the University of Nebraska-Lincoln in December of 2003. She spent one year in the physics department at Vanderbilt University (Nashville, TN) taking graduate courses in electromagnetic theory, quantum mechanics, and statistical mechanics. Andrea began working part-time for the J.A. Woollam Company in 2001 while working on her undergraduate degree. She spent a little under two years working full-time in production and in the Fall of 2006 joined the applications team.

     
James Hilfiker
James Hilfiker
 

James Hilfiker received his Master’s degree in electrical engineering at the University of Nebraska-Lincoln. As an undergraduate, he was involved in research on computer simulations of high-speed microelectronic devices. His graduate interests included materials processing, multilayered nanostructures, and in situ spectroscopic ellipsometry. He designed and built a liquid cell for in situ monitoring of electrochemical deposition. James has been an applications engineer with the J.A. Woollam Company since 1995. His recent publications involve vacuum ultraviolet ellipsometry and liquid crystal characterization.

     

Andrew Martin
Andrew Martin

 

Andrew Martin received a Master’s degree in electrical engineering at the University of Nebraska- Lincoln. As a graduate student, he focused the degradation of anti-reflective coatings in a Low Earth Orbit (LEO) environment. Andrew began working part-time for the J.A. Woollam Company in 2004 while working on his undergraduate degree in computer engineering. He joined the applications team in the winter of 2009.

     
Greg Pribil
Greg Pribil
 

Greg Pribil holds a B.S. degree in electrical engineering from the University of Nebraska-Lincoln. He is currently finishing work on his M.S. degree in electrical engineering. His graduate research includes development of a hollow cathode reactive sputtering UHV system with magnetic field confinement. His research focuses on the deposition of a-Si:H, a-Ge:H and a-SiGe:H thin films for use in solar cells. He has been an applications engineer at the J.A. Woollam Company since January 2002 and works with the in situ spectroscopic ellipsometry group.

     
Neha Singh
Neha Singh
 

Neha Singh received a Master’s degree in electrical engineering at the University of Nebraska- Lincoln. As a graduate student, she focused on femtosecond laser ablation of metal surfaces. She joined the J.A. Woollam Company applications team in 2005, after completing an internship in the analytical services laboratory.

     

Jianing Sun
  Jianing Sun received her Ph.D. in Materials Science and Engineering from the University of Michigan – Ann Arbor.  She holds Master and Bachelor degrees in Chemical Engineering from Tsinghua University in China. Her Ph.D. research involved characterizing low-dielectric constant thin films using Positronium Annihilation Lifetime Spectroscopy (PALS). She worked as a process engineer on back-end processes and characterizations in the semiconductor industry and lecturer at University of Nebraska before joining J. A. Woollam Company in 2008 as an Applications Engineer.
     
Ron Synowicki
Ron Synowicki
 

Ron Synowicki holds a B.S. degree in physics and a Master's degree in electrical engineering from the University of Nebraska-Lincoln. His master’s research involved laboratory simulation of materials degradation in Low Earth Orbit. He has worked in the analytical services laboratory at J.A. Woollam Company since 1993, specializing in customer applications development and service measurements using spectroscopic ellipsometry.

     
Tom Tiwald
Tom Tiwald
 

Tom Tiwald received his Ph.D. in electrical engineering from the University of Nebraska-Lincoln. His Ph.D. research focused on infrared free carrier and phonon absorptions in semiconductors. He also studied the infrared properties of anodic SiO2, thin films, and plasma-treated polycarbonates. Prior to that, he worked with SIMS, AES, and other surface spectroscopies in the semiconductor industry. He joined the J.A. Woollam Company in 1999 as an applications engineer.

     

 

 

 
Request an Ellipsometer Quote
  What's New
   
  Accumap-SE ellipsometer information
   
 
   
  Newsletter Articles
   

Home | Products & Services | Sales & Support | Resources | About Us | Contact Us

© 2010 J.A. WOOLLAM CO. INC.
645 M STREET, SUITE 102
LINCOLN, NE 68508-2243 USA
Ph. 402.477.7501 | Fx. 402.477.8214
sales@jawoollam.com