The M-2000 line of spectroscopic ellipsometers
is engineered to meet the diverse demands of
thin film characterization. An advanced optical
design, wide spectral range, and fast data
acquisition make it an extremely powerful and
The M-2000 delivers both speed and accuracy.
Our patented RCE technology combines
Rotating Compensator Ellipsometry with
detection to collect data from the entire
spectrum (hundreds of wavelengths) in a fraction
of a second with a wide
array of configurations.
The M-2000 is the first ellipsometer truly to
excel at everything from in-situ
process control to large-area
and general purpose thin film characterization.