Characterizing thin film uniformity of large panels just got easier.
The AccuMap-SE combines a high-speed M-2000® spectroscopic
ellipsometer with fast mapping for large panels. Gain confidence
about your coatings that only accurate spectroscopic ellipsometry
measurements can provide. The broad spectral range of the
M-2000 is well suited to all thin films in photovoltaic and flat
panel display applications.