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Characterizing thin film uniformity of large panels just got easier. The AccuMap-SE® combines a high-speed M-2000® spectroscopic ellipsometer with fast mapping for large areas. Gain confidence about your coatings that only accurate spectroscopic ellipsometry measurements can provide. The broad spectral range of the M-2000 is well suited to all thin films in photovoltaic and flat panel display applications.

 





 

 

 

   
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