AccuMap-SE^® Ellipsometer

Characterizing thin film uniformity of large panels just got easier. The AccuMap-SE combines a high-speed M-2000® spectroscopic ellipsometer with fast mapping for large panels. Gain confidence about your coatings that only accurate spectroscopic ellipsometry measurements can provide. The broad spectral range of the M-2000 is well suited to all thin films in photovoltaic and flat panel display applications.