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WVASE32® is the most powerful and comprehensive ellipsometric analysis program available. It provides more modeling options than any other program. WVASE32® is also FAST. It employs state of the art mathematical fitting algorithms for the fastest, most accurate, fits to your data. In addition to modeling and analyzing the ellipsometric data,WVASE32® also analyzes and/or simulates reflectance and transmission data (Neutron reflectivity data, also, for analysis of very tin films such as organics).

Key Benefits:
	FAST!! Written in 32-bit code.
	Allows for acquisition and analysis of many data types: ellipsometric, transmission/reflection intensity, % depolarization, anisotropic, Mueller Matrix, and scatterometry.
	The largest variety of modeling options available.
	Allows user to perform simulations of ellipsometric (reflection or transmission), transmission/reflection intensity, depolarization, anisotropy, etc. at any wavelength or angle of incidence.
	2-D and 3-D graphics. Data and graphs easily exportable to Windows applications such as word processors and spreadsheets

WVASE32® software is highly acclaimed for its large variety of powerful modeling options. The software handles every physical description of effects that are seen optically in your samples. These effects include:


	Graded optical constants (n and k vary at different depths in the film).
	Surface and interfacial roughness
	Thickness non-uniformity
	Optical anisotropy (uniaxial and biaxial)
	Superlattice structures
	Much more!!!

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