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WVASE32®
Ellipsometry Analysis Software
| WVASE32® is the most powerful and comprehensive ellipsometric analysis program available. It provides more modeling options than any other program. WVASE32® is also FAST. It employs state of the art mathematical fitting algorithms for the fastest, most accurate, fits to your data. In addition to modeling and analyzing the ellipsometric data,WVASE32® also analyzes and/or simulates reflectance and transmission data (Neutron reflectivity data, also, for analysis of very tin films such as organics). |
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Key Benefits: |
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Allows for acquisition and analysis of many data types: ellipsometric, transmission/reflection intensity, % depolarization, anisotropic, Mueller Matrix, and scatterometry. |
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The largest variety of modeling options available. |
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Allows user to perform simulations of ellipsometric (reflection or transmission), transmission/reflection intensity, depolarization, anisotropy, etc. at any wavelength or angle of incidence. |
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2-D and 3-D graphics. Data and graphs easily exportable to Windows applications such as word processors and spreadsheets |
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