April 29-30, 2008 ICMCTF
May 12-15, 2008 IEEE Photovoltaics Specialists Conference
WVASE32
This software package makes data acquisition and analysis a breeze. The software allows all users to unleash the power of ellipsometry.
This package allows users to create models for measurements that would need to be performed repeatedly. This is very useful for mapping and quality control.
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