J.A. Woollam Co. - Spectroscopic Ellipsometer Measurement Services

History

The Woollam Company Measurements Laboratory has proudly served the worldwide technical community since 1990. Our laboratory contains top of the line Woollam spectroscopic ellipsometers operated by experienced staff to characterize your materials accurately. A detailed report delivers your results.

Purpose

The Measurements Lab has always played a vital role at the Woollam Company. Its primary function is to demonstrate the capabilities and quality of Woollam ellipsometers. Even more importantly, it supports our customers as they develop new applications and serves as a "training center" for on-site customer training. In addition, our Measurements Lab provides paid measurement services for customers that have a short-term application. The Measurements Lab was recently expanded with a variety of spectroscopic ellipsometer systems.

People

The J.A. Woollam Co., Inc. employs seven full-time applications engineers to serve the measurements lab. Our applications engineers have many years of combined experience in spectroscopic ellipsometry having analyzed thousands of samples. They are always available to discuss your application.

Capabilities

142 nm to 33 microns (0.03-8.5 eV) spectral range - The widest spectral range in the industry!
Delta measured 0-360º using the AutoRetarder on the VASE or rotating compensator configuration on M-2000 and IR-VASE.
Sample Mapping up to 12 " available. In many cases, an application engineer can suggest ways to accommodate even larger sizes.
Small spot-focused beam available.
Low Prices!! Call today for a quote.

Instruments

M-2000D
V-VASE
Focusing M-2000
alpha-SE
VUV-VASE
IR-VASE

Applications

Bulk glass and semiconductor substrates
Refractive index (n & k) determination over a wide spectral range
Thin dielectric overlayers
Native oxides or surface roughness
Metal Films
Multilayer samples
Organic Films
Langmuir-Blodgett films
Anisotropic films

Lithography Applications
Photoresists
ARCs (Antireflective Coatings), organic and non-organic
Transparent conducting oxides (TCOs)
ITO, ZnO, SnO2
Flat Panel Displays
Compound Semiconductors
Thickness of single and multi-layers along with alloy composition identification for many materials

Contact the measurements engineers at: measurements@jawoollam.com