History
The Woollam Company Measurements Laboratory has proudly served the worldwide technical community since 1990. Our laboratory contains top of the line Woollam spectroscopic ellipsometers operated by experienced staff to characterize your materials accurately. A detailed report delivers your results.
Purpose
The Measurements Lab has always played a vital role at the Woollam Company. Its primary function is to demonstrate the capabilities and quality of Woollam ellipsometers. Even more importantly, it supports our customers as they develop new applications and serves as a "training center" for on-site customer training. In addition, our Measurements Lab provides paid measurement services for customers that have a short-term application. The Measurements Lab was recently expanded with a variety of spectroscopic ellipsometer systems.
People
The J.A. Woollam Co., Inc. employs six full-time applications engineers to serve the measurements lab. Our applications engineers have many years of combined experience in spectroscopic ellipsometry having analyzed thousands of samples. They are always available to discuss your application.
Capabilities
- 142 nm to 33 microns (0.03-8.5 eV) spectral range - The widest spectral range
in the industry!
- Delta measured 0-360º using the AutoRetarder on the VASE or rotating compensator configuration on M-2000 and IR-VASE.
- Sample Mapping up to 12 " available. In many cases, an application engineer can suggest ways to accommodate even larger sizes.
- Small spot-focused beam available.
- Low Prices!! Call today for a quote.
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Instruments
- M-2000D
- V-VASE
- Focusing M-2000
- alpha-SE
- VUV-VASE
- IR-VASE
Applications
- Bulk glass and semiconductor substrates
- Refractive index (n & k) determination over a wide spectral range
- Thin dielectric overlayers
- Native oxides or surface roughness
- Metal Films
- Multilayer samples
- Organic Films
- Langmuir-Blodgett films
- Anisotropic films
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- Lithography Applications
- Photoresists
- ARCs (Antireflective Coatings), organic and non-organic
- Transparent conducting oxides (TCOs)
- ITO,
ZnO,
SnO2
- Flat Panel Displays
- Compound Semiconductors
- Thickness of single and multi-layers along with alloy composition identification for many materials
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Contact the measurements engineers at: measurements@jawoollam.com
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