J. A. Woollam Co., Inc. is a manufacturer of spectroscopic ellipsometers for non-destructive thin film and bulk material characterization.

Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characterization of all types of materials: dielectrics, semiconductors, metals, organics, and more.

We offer ellipsometers covering a spectral range to meet any need (from the vacuum UV to the far IR). Our ellipsometers come with many upgrade options: automated sample translation, variable temperature (heating or cooling), focusing optics, liquid cells, etc.